• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
  • 引用文献
  • 法律状态
  • 优先权
    • 专利摘要:
    According to the method of the invention, samples undergoing analysis for sorting are irradiated one by one in order to excite X-ray fluorescence. In order to take into account the background radiation, the quality whereof varies according to the frequency of the excited radiation, the radiation peak intensity I1 is measured, as well as the respective intensity I2 is measured at the same point of the radiation spectrum but in an essentially wider frequency range than the radiation peak. On the basis of the measured intensities I1 and I2 are defined the intensities of the X-ray fluorescence F and the background radiation T, and the ratio of these two is used as the selective criterion when sorting the analyzed samples.
    公开号:SU1417802A3
    申请号:SU843716287
    申请日:1984-03-22
    公开日:1988-08-15
    发明作者:Йоханнес Сипиля Хейкки；Юхани Лааманен Кай
    申请人:Оутокумпу Ой (Фирма)；
    IPC主号:
    专利说明:

    four

    00 Oh
    to

    cm
    The invention relates to methods for analyzing the composition of a substance using x-ray or gamma radiation, especially to methods for sorting ore, an x-ray using an adiometric or gamma-gamma method.
    The purpose of the invention is to increase the accuracy and reliability of the measurement of the content of the element being determined in the surface layer of the sample.
    FIG. 1 is a diagram of the device on which the invention can be implemented; in fig. 2 is a diagram of the choice of positions and widths of the recording device channels.
    The gamma-radiation source 1 irradiates the sample 2 ore, which freely falls past the detector 3, recording secondary radiation from the sample. The detector 3 placed in the protective screen 4 may be, in particular, a scintillation counter in the spectrometric mode, connected to a two-channel recording circuit (not shown). The X-ray sorting secondary radiation spectrum contains the peak of the characteristic X-ray radiation of the detectable element entering into. it is a valuable mineral, and the background radiation, which is continuously distributed in this region of the spectrum, is formed mainly by Compton scattering of the primary radiation. When sorting samples by the gamma-gamma method, the secondary radiation spectrum contains backscattered sample peaks into primary radiation and background radiation.
    In FIG. 2 parts of the spectrum of the secondary radiation shows the choice, positions and widths of the channels of the two-channel recording circuit. The centers of the channels coincide with each other and with the center of the peak of the secondary radiation lying on the background lining. According to the invention, the first (I) recording channel cxe№i has the total intensity (lc) of the secondary radiation peak (the peak is entirely), for example, the characteristic x-ray radiation of the detected element and the background under it. The second channel (II) has a much larger width and the same peak of the secondary radiation as a whole and background radiation of a higher intensity (ij)
    Denote the intensity of the characteristic x-ray radiation
    14178022
    as F, the background radiation recorded by the first channel, as T and recorded by the second channel as CT, where K 1.
    Then I g
    I;
    T
    CT
    (one)
    (2)
    Subtracting the puff (2) from the expression 10
    nor (1), we get 1d-1 T (K-1)
    The intensity of the background radiation T is described by the expression
    II-IT. (four)
    15
    From expressions (1) and (2) we obtain the following expression for the intensity of x-ray fluorescence F
    R - Kicli K-1
    (five)
    20
    Intensity ratio f and t
    .
    IS-IT
    (6)
    five
    0
    five
    five
    0
    five
    0
    serves as a parameter by which the content of the element to be determined on the surface of the sample is determined, and 2. By the value of the F / T parameter, the sample to be analyzed is sorted as ore or as an empty rock depending on whether it exceeds the specified sorting criterion or not. Invention Formula
    1. A method of sorting ore samples according to the content of a detectable element in them, consisting in irradiating ore samples with radiation with energy sufficient to excite the characteristic X-ray radiation of a detectable element from at least one radiation source, recording with a spectrometric detector with a two-channel scheme for recording the total intensity Ij secondary radiation peak from the sample and background, characterized in that, in order to increase the accuracy and reliability of the determination of the content, An element in the surface layer of the sample additionally records the total intensity 1c of the peak of the secondary radiation and background wider than the first channel of the recording circuit, the center of which coincides with the center of the first channel. Measured intensities are used.
    f4je.f
    tpue.2
    权利要求:
    Claims (3)
    [1]
    Claim
    1. A method for sorting ore samples according to the content of the element being determined, which consists in irradiating ore samples with radiation with an energy sufficient to excite characteristic x-ray radiation of the element being determined from at least one radiation source, recording a spectrometric detector with a two-channel scheme for recording the total intensity Ij of the secondary peak radiation from the sample and background, characterized in that, in order to increase the accuracy and reliability of determining the content of element in the surface layer of the sample, additionally record the total intensity of the 1s peak of secondary radiation and the background wider than the first channel of the recording circuit, the center of which coincides with the center of the first channel, use the measured intensities and Ig to calculate the intensities of the secondary radiation F and background T, and the content of the element being determined is judged by the value of the F / T ratio.
    [2]
    2. The method according to p. D, characterized by VeM, that a scintillation detector is used as a secondary radiation detector from the ore sample.
    [3]
    3. The method according to π. 1.or 2, about t - h characterized in that the source gamma radiation energy is selected in the range from 300 to 660 keV.
    (rig. 2
    类似技术:
    公开号 | 公开日 | 专利标题
    US3521064A|1970-07-21|Analysis of gamma ray energy spectrum for constituent identification
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    SU1417802A3|1988-08-15|Method of sorting ore samples by content of analyzed element thereof
    US4016419A|1977-04-05|Non-dispersive X-ray fluorescence analyzer
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    GB2083618A|1982-03-24|A method and apparatus for analysis of heavy element content of ore
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    SU1612247A1|1990-12-07|Method of fluorescent x-ray radiometric analysis
    SU1224688A1|1986-04-15|Method of determining background in x-ray fluorescence analysis of complex composition media
    SU1315880A1|1987-06-07|Method of absorption x-ray analysis of ore
    SU808923A1|1981-02-28|Method of background determition in multi-element x-ray radiometric analysis
    SU868502A1|1981-09-30|Method of roengen-radiometric determination of elements content in hree-component complex ores
    SU1092394A1|1984-05-15|Method of extracting legitimate signal in x-ray spectral analysis
    SU884402A1|1991-02-28|Method of radiation computational tomography
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    SU1083100A1|1984-03-30|Method and device for fluorescent x-ray radiometric analysis of substance compositition
    SU1176221A1|1985-08-30|Method of radiospectral fluorescence determination of high-and medium-z element content |
    JPH06130004A|1994-05-13|Fluorescent x-ray qualitative analysis method using spectrum processing
    RU2086964C1|1997-08-10|Method for automated roentgenoradiometric material assay
    同族专利:
    公开号 | 公开日
    SE8401396D0|1984-03-13|
    ZA842097B|1984-10-31|
    FI830968L|1984-09-24|
    BR8401416A|1984-11-06|
    US4653081A|1987-03-24|
    SE8401396L|1984-09-24|
    FI830968A0|1983-03-23|
    FI72211B|1986-12-31|
    SE461552B|1990-02-26|
    CA1219689A|1987-03-24|
    FI72211C|1987-04-13|
    AU2593284A|1984-09-27|
    AU578016B2|1988-10-13|
    引用文献:
    公开号 | 申请日 | 公开日 | 申请人 | 专利标题
    FR1389417A|1963-04-01|1965-02-19|Commissariat Energie Atomique|Dosing method and devices by applying|
    US3655964A|1968-05-06|1972-04-11|David Laurie Slight|Ionizing radiation apparatus and method for distinguishing between materials in a mixture|
    DE2703562A1|1977-01-28|1978-08-03|Max Planck Gesellschaft|METHOD AND EQUIPMENT FOR ANALYSIS OF ROENTGEN FLUORESCENTS|
    JPS5430894A|1977-08-12|1979-03-07|Hitachi Ltd|Automatic fluorescent x-ray analysis apparatus|
    AU552202B2|1980-06-11|1986-05-22|Commonwealth Scientific And Industrial Research Organisation|Method and apparatus for material analysis|
    JPS5745481A|1980-08-04|1982-03-15|Schlumberger Overseas|Method of and apparatus for spectroscopic analysis on elements of stratum|
    FI61361C|1980-09-15|1982-07-12|Outokumpu Oy|FRAMEWORK FOR ANALYSIS FOAL ANALYSIS AV MALM MED ANVAENDNING AV GAMMASTRAOLNING|
    JPS57179731A|1981-04-30|1982-11-05|Nippon Atom Ind Group Co Ltd|Method and apparatus for measuring concentration of element|US5206699A|1988-05-06|1993-04-27|Gersan Establishment|Sensing a narrow frequency band of radiation and gemstones|
    GB2219082B|1988-05-06|1992-08-26|Gersan Ets|A method of identifying specific objects or zones|
    AU620681B2|1989-01-19|1992-02-20|De Beers Industrial Diamond DivisionLimited|Determination of background radiation|
    GB9211734D0|1992-06-03|1992-07-15|Gersan Ets|Prospecting for diamonds|
    GB9417665D0|1994-09-02|1994-10-19|Gersan Ets|Distinguishing natural from synthetic diamond|
    GB0011227D0|2000-05-11|2000-06-28|Ici Plc|Density measurement method and apparatus therefor|
    US6770830B2|2002-08-15|2004-08-03|Capintec, Inc.|Radioactive seed sorter and method for sorting radioactive seeds|
    US9392961B2|2003-12-17|2016-07-19|Check-Cap Ltd.|Intra-lumen polyp detection|
    法律状态:
    优先权:
    申请号 | 申请日 | 专利标题
    FI830968A|FI72211C|1983-03-23|1983-03-23|FOERFARANDE FOER BEAKTANDE AV STRAOLNINGSBAKGRUNDEN FOER BESTAEMNING AV STRAOLNINGSINTENSITETER SOM UPPSTAOR I KROPPAR SOM SKALL ANALYSERAS.|
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